atomic force microscopy

Combined microscopies study of the C-contamination induced by extreme-ultraviolet radiation: A surface-dependent secondary-electron-based model
S. Prezioso, M. Donarelli, F. Bisti, L. Palladino, S. Santucci, S. Spadoni, L. Avaro, A. Liscio, V. Palermo, L. Ottaviano
Bulk phase two dimensional chiral growth of 6, 13 Pentacenequinone on SiO2
P. De Marco, F. Fioriti, F. Bisti, P. Parisse, S. Santucci, L. Ottaviano